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Scientific Computing International

Map6355 Corte Del Abeto, Ste. C105
Carlsbad, CA 92011
United States
Phone: +1 760-634-3822
Fax: +1 760-634-3826
Provides metrology tools for thin-film characterization, material analysis, spectroscopic ellipsometry, and optical thin-film design. Products include a tool that simultaneously and unambiguously measures thickness, index, critical dimensions, surface roughness, composition, crystallinity, and optical constants of multilayer structures.
Established: 1993
Employees: 10
Facility area (sq ft): 8000
Ownership type: Privately Owned
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