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Atomic Force Microscopes

An atomic force microscope is a high-resolution imaging and measurement instrument used in nanotechnology, materials science, and biology. It is a type of scanning probe microscope that operates by scanning a sharp tip (usually a few nanometers in diameter) over the surface of a sample at a very close distance. The tip interacts with the sample's surface forces, providing detailed information about the sample's topography and properties at the nanoscale. Learn more about atomic force microscopes →

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Mad City Labs Inc. - Madison, WI

Designs and manufactures piezo nanopositioning systems and nanoscale precision instruments for metrology, photonics, astronomy, and microscopy. Closed loop nanopositioners with low noise, high stability PicoQ sensors. Products include piezo nanopositioners, single molecule microscopes, high precision micropositioning, AFM, and custom design.

Stock Manufacturer

Advanced Surface Microscopy Inc. - Indianapolis, IN

Glossary

atomic force microscope An atomic force microscope (AFM) is a high-resolution imaging and measurement instrument used in nanotechnology, materials science, and biology. It is a type of scanning probe microscope that operates by scanning a sharp tip (usually a few...

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