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< Spectroscopy
Other Spectroscopy Products
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Equipment
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39 products
Other Spectroscopy Products
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Ruled and Holographic Gratings
Optometrics Corp.
Type:
Component
MicroPL
Edinburgh Instruments Ltd.
Type:
Equipment
Excitation / Emission Range:
360 nm – 850 nm (std)
Excitation Modes:
Widefield
Objective Magnification:
from 5× to 100×
ZEISS Optical Gratings
Carl Zeiss Spectroscopy GmbH
Type:
Component
Groove density:
22 – 3600 l/mm
Radius of curvature:
plane or 50 – 1000 mm
Spectral range:
120 nm – 20 µm
ZEISS Spectrometer Modules
Carl Zeiss Spectroscopy GmbH
Type:
System
Integration time:
> 1.1 ms
Numerical aperture:
0.22
Resolution (FWHM):
3 nm
DeepUV Gratings
Optometrics Corp.
Type:
Component
Size:
4×4mm - 30×30mm
UV Performance Range:
190 - 400 nm
Mini-Chrom Monochromator
Optometrics Corp.
Type:
Equipment
f Number:
3.9
Focal Length:
74 mm
Operating Temperature:
-20 °C to +80 °C
Entrance Slits
Graticules Optics Ltd.
Type:
Component
Electroplated:
>10 µm
Glacier X
m-oem
Type:
Component
Filter Type:
LVF (Long)
Grating:
700/530
Slit Width:
25 µm slit
Quest X
m-oem
Type:
Component
Filter Type:
LVF (Long)
Grating:
Ruled, 600/400
Slit Width:
25 µm slit
Exemplar Plus
m-oem
Type:
Component
Filter Type:
LVF (Long)
Grating:
Ruled, 300/280
Slit Width:
25 µm slit
Exemplar T
m-oem
Type:
Component
Fixed Grating Spectrograph
HORIBA
Type:
Equipment
Scanning System
Projectina AG
Type:
Equipment
ProbePro Mini
Timegate Instruments Ltd.
Type:
Equipment
Diameter:
35 mm
Length:
175 mm
Microprobe
Timegate Instruments Ltd.
Type:
Equipment
SampleCube
Timegate Instruments Ltd.
Type:
Equipment
VeeMAX III
PIKE Technologies Inc.
Type:
Equipment
10Spec
PIKE Technologies Inc.
Type:
Equipment
Mid-IR IntegratIR
PIKE Technologies Inc.
Type:
Equipment
Laboratory Instruments - mills, grinders
Fritsch GmbH - Milling and Sizing
Type:
Equipment
SERS Substrates
Amerigo Scientific
Type:
Component
XperRF
Nanobase Inc.
Type:
System
V/VX2740 Waveform Digitizer
CAEN Spa
Type:
Equipment
Bin Resolution:
16 bit
ENOB:
11.7 (Typ)
FPGA:
Open
XperRAM S Series
Nanobase Inc.
Type:
System
Active Pixels (detector):
2000 × 256 pixels
Raman Peak Efficiency:
≥ 90%
Scanning Positioning Accuracy:
≤ 1µm
IRis-Core
IRsweep
Type:
System
Center Wave Numbers:
2200 cm-1 (4.5µm) - 900 cm-1 (11.1 µm)
Optical Power:
20 mW - 300 mW
Spectral Resolution:
<10 MHz (0.0003 cm-1)
IRcell-S - Multipass Absorption Cell
IRsweep
Type:
Equipment
Internal Volume:
31 ml
Mirror Design:
Single Piece
Path Length:
4.03 m
Portable Raman System
Technospex Pte. Ltd.
Type:
System
SphereSpectro 150H
Gigahertz-Optik Inc.
Type:
System
ATR Fiber Probe for hazardous environments
art photonics GmbH
Type:
Component
Industrial application:
12 mm diam shaft
Lab application:
6 m diam shaft
Reflection & Fluorescence Fiber Optic Probes
art photonics GmbH
Type:
Equipment
Operating Temperature:
-70 °C to +200 °C
Pressure:
10 Bar
Wavelength Range (UV/VIS):
190-1300 nm
ATR Probes for FTIR Process Spectroscopy
art photonics GmbH
Type:
Equipment
1.1 to 17:
µ
-150 to +250:
°C
6.3 mm to 12 mm:
DIA
microDXP
XIA LLC
Type:
Component
Dimensions:
54W×86L×5H
Mercury
XIA LLC
Type:
Component
Meas. Type:
Fluorescence
DWS RheoLab
LS Instruments AG
Type:
Equipment
Complex Modulus G*:
1-50 kPa
Frequency:
0.1 Hz-10 MHz
Sample Volume:
150-1500 uL
NanoLab
LS Instruments AG
Type:
Equipment
Excitation Wavelength:
685 nm
Sample Volume:
50-2000 uL
Scattering Angle:
90°
XLNCE SMX-BEN XRF Analyzer
EDAX Inc., Corporate Headquarters
Type:
Equipment
Meas. Technique:
Fluorescence
Orbis Micro-XRF Elemental Analyzer
EDAX Inc., Corporate Headquarters
Type:
Equipment
SimpleTau
Becker & Hickl GmbH
Type:
System
WaveCapture FBG Analyzer System
BaySpec Inc.
Type:
System
Channel Number:
1 or 4
Frequency Response Time:
up to 5 kHz
Readout Resolution:
1 pm
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