Close

Search

Search Menu
Photonics Media Photonics Buyers' Guide Photonics EDU Photonics Spectra BioPhotonics EuroPhotonics Industrial Photonics Photonics Showcase Photonics ProdSpec Photonics Handbook
More News
SPECIAL ANNOUNCEMENT
2016 Photonics Buyers' Guide Clearance! – Use Coupon Code FC16 to save 60%!
share
Email Facebook Twitter Google+ LinkedIn Comments

Candela Instruments Introduces Automated Surface Inspection System for Optoelectronic Substrates

Photonics.com
Aug 2001
FREMONT, Calif., Aug. 13 -- Candela Instruments announces the availability of an Optical Surface Analyzer (OSA) for substrates used in the manufacture of active and passive optoelectronic devices. The C1 offers a combination of surface inspection and metrology applications, making it a versatile system for substrate qualification, yield improvement or contamination control.
   Available with manual or automated handling for up to 200-mm-diam substrates, the C1 is suitable for use in laboratories, pilot lines or volume manufacturing lines.


Comments
Terms & Conditions Privacy Policy About Us Contact Us
back to top

Facebook Twitter Instagram LinkedIn YouTube RSS
©2016 Photonics Media
x We deliver – right to your inbox. Subscribe FREE to our newsletters.