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Deposition Controls Refractive Index

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Kevin Robinson

Japanese researchers at Osaka University in Suita and the Institute for Laser Technology in Osaka have demonstrated that atomic layer deposition can be used to manipulate the refractive index of an optical thin film by precisely varying the thickness and ratio of its constituent layers. The technique opens the door to improving numerous applications, such as the manufacture of solar cells and laser diodes. Using a specially designed growth chamber, researchers have used atomic layer deposition to tailor the refractive index of a thin film by controlling the thickness of individual layers...Read full article

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    Published: July 2002
    Basic SciencechemicalsenergyResearch & TechnologyTech Pulse

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