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BAE Systems Sensor Solutions - Fairchild - Thermal Imaging Solutions 4/24 LB

5,000 Expected at SPIE's 47th Annual Meeting

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SEATTLE, July 8 - More than 5,000 are expected to attend SPIE's 47th annual meeting, and 314 companies are exhibiting at the three-day event, said Janice Gaines Walker, SPIE director of events.
   Special events will include a nanotechnology workshop Thursday. Presenters will be: James Grote of the Air Force Research Laboratory, Larry Dalton of the University of Washington and University of Southern California, Paras N. Prasad of the State University of New York at Buffalo, Tobin Marks of Northwestern University, Richard A. Vaia of the Air Force Research Laboratory, Vicki L. Colvin of Rice University and Michael T. Postek of the National Institute of Standards and Technology.

Trioptics GmbH - Worldwide Benchmark 4-24 LB

Published: July 2002
000 Expected at SPIEs 47th Annual Meeting

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