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AngstroVision Developing Nano-Imaging Device

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SAN FRANCISCO, Jan. 23 -- AngstroVision Inc. is developing a new nano-imaging device to target characterization and metrology applications in the materials and information technology markets. This new technology creates 3-D images with resolutions in the range of several nanometers that can be acquired at high speeds in a wide range of environments, AngstroVision said, and it eliminates the need for preparation of samples or destruction of samples. The company plans to ship its first product in 2004. For more information, visit: www.angstrovision.comRead full article

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    Published: January 2003
    Glossary
    metrology
    Metrology is the science and practice of measurement. It encompasses the theoretical and practical aspects of measurement, including the development of measurement standards, techniques, and instruments, as well as the application of measurement principles in various fields. The primary objectives of metrology are to ensure accuracy, reliability, and consistency in measurements and to establish traceability to recognized standards. Metrology plays a crucial role in science, industry,...
    metrologyNews & Features

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