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An atomic force microscope that can visualize structures as small as one nanometer in diameter is one new feature of Rensselaer Polytechnic Institute's (RPI) remodeled Rensselaer Nanotechnology Center (RNC), which opens today. The center also houses a nanoscale particle generator and the equipment needed to produce and study nanotubes. The facility will foster research in areas including developing new materials with extraordinary strength, dramatically downsizing electronic components and creating biologically based replacements for skin and bone. The center, founded in April 2001 under the...Read full article

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    Published: September 2003
    Glossary
    atomic force microscope
    An atomic force microscope (AFM) is a high-resolution imaging and measurement instrument used in nanotechnology, materials science, and biology. It is a type of scanning probe microscope that operates by scanning a sharp tip (usually a few nanometers in diameter) over the surface of a sample at a very close distance. The tip interacts with the sample's surface forces, providing detailed information about the sample's topography and properties at the nanoscale. Key features and principles of...
    nanotechnology
    The use of atoms, molecules and molecular-scale structures to enhance existing technology and develop new materials and devices. The goal of this technology is to manipulate atomic and molecular particles to create devices that are thousands of times smaller and faster than those of the current microtechnologies.
    atomic force microscopeBasic ScienceMicroscopynanotechnologyNews BriefsPhotonics Tech BriefsRensselaer Nanotechnology CenterRensselaer Polytechnic InstituteRPIspectroscopyThermo Electron

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