Search
Menu
Rocky Mountain Instruments - Infrared Optics LB

Atomic Force Microscopy Acquisition Rates Accelerate

Facebook X LinkedIn Email
Hank Hogan

Because they are mechanical devices, conventional atomic force microscopes (AFMs) can see fine details but not fast ones. The instruments make nanoscale measurements by dragging a sharp stylus across a sample, and their readout involves tracking the motion of a light beam reflected from a microcantilever that bears the stylus. As a result, it takes approximately 30 s to move the microscope's head across a surface and collect an image. This is too slow to enable the user to follow molecular processes, and it impacts the application of AFMs in nanolithography and data storage. Now...Read full article

Related content from Photonics Media



    Articles


    Products


    Photonics Handbook Articles


    White Papers


    Webinars


    Photonics Dictionary Terms


    Media


    Photonics Buyers' Guide Categories


    Companies
    Published: March 2005
    Accent on ApplicationsApplicationsatomic force microscopesBasic Scienceindustriallight beammechanical devicesmicrocantileverMicroscopy

    We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.