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4D Receives NASA Award

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TUCSON, Ariz., April 27, 2006 -- 4D Technology received a 2005 NASA Goddard Achievement in Excellence Award last month for its work with NASA to develop the SpeckleCam, a dynamic electronic speckle pattern interferometer (ESPI) that enables precision metrology on large flight hardware for the James Webb Space Telescope (JWST). The SpeckleCam's acquisition time of nine nanoseconds for a single measurement is 10,000,000 times faster than a conventional phase-shifting interferometer, 4D said, making the system insensitive to vibration and air turbulence. A second, higher-powered unit is currently on order and nearing delivery....Read full article

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    Published: April 2006
    Glossary
    metrology
    Metrology is the science and practice of measurement. It encompasses the theoretical and practical aspects of measurement, including the development of measurement standards, techniques, and instruments, as well as the application of measurement principles in various fields. The primary objectives of metrology are to ensure accuracy, reliability, and consistency in measurements and to establish traceability to recognized standards. Metrology plays a crucial role in science, industry,...
    4D Technologyelectronic speckle pattern interferometerESPIGoddard Achievement in Excellence AwardJames Webb Space TelescopeJWSTmetrologyNASANews & FeaturesSensors & DetectorsSpeckleCam

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