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Hamamatsu Corp. - Earth Innovations LB 2/24

Geometric Model Improves Cantilever-Based Sensing

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Richard Gaughan

Micromachined cantilevers in atomic force microscopes and sensors provide precise measurements of everything from molecular binding to acceleration, but their sensitivity can present a problem. A reflected laser beam typically is used to measure small deflections in the cantilevers, which are a couple of hundred microns long. The location of the reflected beam depends on just about every geometrical relationship in the system, which makes it difficult to provide absolute calibration for cantilever-based instruments. Micromachined cantilevers are sensitive enough to measure processes...Read full article

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    Published: May 2006
    atomic force microscopesBasic ScienceFeaturesMicromachined cantileversMicroscopySensors & Detectors

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