Search
Menu
CASTECH INC - New Building the Bridge of Light

Super Imaging at a Distance

Facebook X LinkedIn Email
Combining SNOM with a superlensing material enables contact-free imaging.

Hank Hogan

In conventional microscopy, resolution is limited to about λ/2 of the light source because of diffraction. Scanning near-field microscopy (SNOM), in which a nanometer-scale probe with a tiny aperture is raster-scanned across an object of interest, and scattering SNOM, in which an apertureless metallic probe is brought into close contact with the object, enable imaging below the diffraction limit. However, these methods can damage delicate specimens — making live-cell imaging, for example, challenging — and the technique is limited to the specimen’s surface. Now investigators at Max...Read full article

Related content from Photonics Media



    Articles


    Products


    Photonics Handbook Articles


    White Papers


    Webinars


    Photonics Dictionary Terms


    Media


    Photonics Buyers' Guide Categories


    Companies
    Published: November 2006
    Basic ScienceCommunicationsLight SourcesMicroscopyResearch & TechnologyScanning near-field microscopyTech PulseLEDs

    We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.