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Peter de Groot Elected SPIE Fellow

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Peter de Groot, PhD, director of research and development for Zygo Corp., has been elected a SPIE fellow for his many contributions to high-precision interferometry. "Dr. de Groot is the inventor and developer of optical metrology tools for inspecting a range of optical and engineering surfaces from MEMS (microelectromechanical systems) devices to airplane wings -- with more than 75 patents issued and pending and four R&D 100 Awards to his name, he is truly a prolific and leading inventor in the optical metrology arena," SPIE said in a statement. Zygo Corp. is based in Middlefield, Conn.,...Read full article

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    Published: April 2008
    Glossary
    metrology
    Metrology is the science and practice of measurement. It encompasses the theoretical and practical aspects of measurement, including the development of measurement standards, techniques, and instruments, as well as the application of measurement principles in various fields. The primary objectives of metrology are to ensure accuracy, reliability, and consistency in measurements and to establish traceability to recognized standards. Metrology plays a crucial role in science, industry,...
    nano
    An SI prefix meaning one billionth (10-9). Nano can also be used to indicate the study of atoms, molecules and other structures and particles on the nanometer scale. Nano-optics (also referred to as nanophotonics), for example, is the study of how light and light-matter interactions behave on the nanometer scale. See nanophotonics.
    photonics
    The technology of generating and harnessing light and other forms of radiant energy whose quantum unit is the photon. The science includes light emission, transmission, deflection, amplification and detection by optical components and instruments, lasers and other light sources, fiber optics, electro-optical instrumentation, related hardware and electronics, and sophisticated systems. The range of applications of photonics extends from energy generation to detection to communications and...
    airplanede GrootEmploymentengineeringfellowImagingindustrialinterferometersMEMSmetrologynanoNews Briefsoptical metrologyOpticsPeter de GrootphotonicsPhotonics Tech BriefsSPIEZygo

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