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Photonics Spectra
Feb 2009
Matrix Metrologies Inc. has released an eight-page brochure on its full line of benchtop x-ray fluorescence (XRF) systems, which are designed for the nondestructive measurement of both metal film thickness and the composition of common metal finishing and microelectronics industry plating and coated layers. The systems perform measurements in seconds and can measure single, double and tri-layer coatings as well as alloy coatings.

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