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Agilent Wins Testing Awards

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SANTA CLARA, Calif., May 11, 2010 — Agilent Technologies Inc. recently announced that its Medalist i3070 Series 5 in-circuit test solution garnered two major technology awards during the Nepcon Shanghai 2010 trade show in late April. These awards recognize innovation and reliability in improving product quality in today’s mature SMT manufacturing environment. The i3070 Series 5 was named winner for the test category in both the fourth SMT China Vision awards and the 2010 EM Asia Innovation awards. In addition, the series was a finalist in both the EDN Innovation 2009 and the Test & Measurement...Read full article

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    Published: May 2010
    AgilentAmericasAsia-PacificBusinessCaliforniaEDN InnovationEM Asia Innovationin-circuit testingindustrialIndustry EventsMedalist i3070 Series 5Nepcon ShanghaiSMT China VisionTest & MeasurementTest & Measurement World

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