Search
Menu
Gentec Electro-Optics Inc   - Measure With Gentec Accuracy LB

Rudolph Acquires MKS Instruments Software Biz

Facebook X LinkedIn Email
FLANDERS, N.J., Aug. 25, 2010 — Rudolph Technologies Inc. reported that it acquired selected assets of the Yield Dynamics software business from MKS Instruments of Andover, Mass., a global provider of technologies to power, control, measure and analyze advanced processes in high growth applications. The company’s purchase includes selected assets and intellectual property related to MKS yield management software used by semiconductor manufacturers and fabless semiconductor suppliers. In addition to the software acquisition, approximately 35 engineering and applications personnel, most of whom are based in...Read full article

Related content from Photonics Media



    Articles


    Products


    Photonics Handbook Articles


    White Papers


    Webinars


    Photonics Dictionary Terms


    Media


    Photonics Buyers' Guide Categories


    Companies
    Published: August 2010
    Glossary
    metrology
    Metrology is the science and practice of measurement. It encompasses the theoretical and practical aspects of measurement, including the development of measurement standards, techniques, and instruments, as well as the application of measurement principles in various fields. The primary objectives of metrology are to ensure accuracy, reliability, and consistency in measurements and to establish traceability to recognized standards. Metrology plays a crucial role in science, industry,...
    process control
    The collection and analysis of data relevant to monitoring the rate and quality of industrial production, either continuously or in batches. Corrections can be made manually or automatically, via a feedback control loop.
    acquisitionsAmericasAssetsBusinessChinadata analysisdata management systemdefect inspectionengineeringfabless semiconductormetrologyMKS Instrumentsprocess controlRudolphRudolph Technologies Inc.semiconductorsSoftwaresoftware acquisitionTest & MeasurementTianjintransactionWafer fabsyieldYield Dynamicsyield management software

    We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.