- UKIVA to Present CMOS Seminar at Sensing Tech Exhibition
ROYSTON, England, Sept. 10, 2010 — The UK Industrial Vision Association (UKIVA) announced it will contribute to the seminar and workshop activities at the new Sensing Technology exhibition which will take place at the NEC in Birmingham, England, on Sept. 28-29, 2010.
The new exhibition (www.sensingtechnology.co.uk) will showcase the latest sensing and related technologies and innovations for applications in science, commerce and industry.
On Sept. 28, UKIVA will present its seminar titled, “Advances in imaging CMOS sensors.” Various UKIVA members will contribute material to the presentation, which will showcase how different CMOS architectures can be used to produce imaging sensors with a variety of capabilities. In addition, at least one UKIVA member from the academic community will provide information on the latest developments that can be expected using this technology.
Extremely versatile, CMOS sensors range from very small to megapixel resolution, from very fast response to very long exposure, from linear to log/lin and can offer a very high dynamic range. Sensor read-out options for area scan sensors include full frame to selected area read-out only. Line-scan options are also available.
The organization will also participate in a workshop following the presentation for interested parties who want to find out more about the technologies discussed.
For more information, visit: www.ukiva.org
- In optics, the total radiant energy incident on a surface-per-unit area. It is equal to the integral over time of the radiant flux density. Also known as radiant exposure.
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