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NIST Selects JEOL Microscope for Federal Facility

Photonics.com
Sep 2010
PEABODY, Mass., Sept. 22, 2010 — The National Institute of Standards and Technology (NIST) placed an order for JEOL’s atomic resolution analytical JEM-ARM200F transmission electron microscope (TEM) through a competitive award process and funded by the American Recovery and Reinvestment Act.

The TEM will be a featured instrument in the NIST Precision Measurement Laboratory in Boulder, Colo.

“We are very excited to be partnering with this premier federal government facility and are confident the opportunity will recognize the high performance capability of this new TEM platform,” said Peter Genovese, president of JEOL USA. “We believe having hands-on access will open up unexplored horizons and world-class results for the scientific team who will be using it.”

Introduced in 2009, the ARM200F has set a new benchmark for advanced aberration-corrected S/TEM technology with the highest resolution commercially available in its class, said the company.

JEOL manufactures electron optical equipment and instrumentation for high-end scientific and industrial research and development. Its core product groups include electron microscopes, instruments for the semiconductor industry and analytical instruments.

For more information, visit:  www.jeol.com 



GLOSSARY
aberration
A departure from ideal paraxial imaging behavior. The distortion of an optical field wavefront as it is propagated through the elements of an optical system. The field distortion is due to the interaction of the wavefront with ideal components and therefore a result of optical component behavior.
optical
Pertaining to optics and the phenomena of light.
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