Search Menu
Photonics Media Photonics Buyers' Guide Photonics EDU Photonics Spectra BioPhotonics EuroPhotonics Industrial Photonics Photonics Showcase Photonics ProdSpec Photonics Handbook
More News
Email Facebook Twitter Google+ LinkedIn Comments

  • Zoughi Receives Keithley Award
Nov 2010
CLEVELAND, Nov. 4, 2010 — The IEEE has named Dr. Reza Zoughi as the recipient of the 2011 Joseph F. Keithley Award in Instrumentation and Measurement. Zoughi is being recognized for his contributions to microwave and millimeter-wave measurement techniques for nondestructive testing and evaluation. The award, sponsored by Keithley Instruments Inc., is presented for outstanding contributions in the field of electrical measurement. It consists of a bronze medal, a certificate and an honorarium.

The award will be presented to Zoughi on May 11, 2011, during the IEEE International Instrumentation and Measurement Technology Conference at the Four Points by Sheraton Hangzhou, Binjiang, Hangzhou, China.

Zoughi, a fellow of the Institute of Electrical and Electronics Engineers (IEEE), received his BSEE, MSEE and PhD degrees in electrical engineering (radar remote sensing, radar systems and microwaves) from the University of Kansas. Currently, he is the Schlumberger Distinguished Professor of Electrical and Computer Engineering at Missouri University of Science and Technology (Missouri S&T, formerly University of Missouri-Rolla).

In the past two decades, his efforts in expanding the utility of microwave and millimeter-wave inspection techniques have brought significant recognition to the field of nondestructive testing and evaluation. Zoughi’s research team has developed millimeter-wave imaging systems and methods for inspecting the spray-on foam insulation of the space shuttle’s external fuel tank, in addition to a real-time, high-resolution and portable microwave camera that is expected to find widespread utility. He has played a leading role in developing near-field microwave and millimeter-wave techniques and developed near-field measurement systems using open-ended waveguide and other more sophisticated probes for evaluating a host of defects in thin and thick and layered composite structures.

Criteria considered by the award’s IEEE evaluation committee include innovation or development, social value, uniqueness of concept, other technical accomplishments and the quality of the nomination. The award is administered through the technical field awards council of the IEEE awards board and is independent of Keithley Instruments.

For more information, visit: 

An electromagnetic wave lying within the region of the frequency spectrum that is between about 1000 MHz (1 GHz) and 100,000 MHz (100 GHz). This is equivalent to the wavelength spectrum that is between one millimeter and one meter, and is also referred to as the infrared and short wave spectrum.
Acronym for profile resolution obtained by excitation. In its simplest form, probe involves the overlap of two counter-propagating laser pulses of appropriate wavelength, such that one pulse selectively populates a given excited state of the species of interest while the other measures the increase in absorption due to the increase in the degree of excitation.
Terms & Conditions Privacy Policy About Us Contact Us
back to top

Facebook Twitter Instagram LinkedIn YouTube RSS
©2016 Photonics Media
x We deliver – right to your inbox. Subscribe FREE to our newsletters.