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Applied Precision Expands TIRF Capabilities

Photonics.com
Dec 2011
ISSAQUAH, Wash., Dec. 19, 2011 — Applied Precision Inc. is set to integrate enhanced total internal reflection fluorescence (TIRF) microscopy into its product line now that is has licensed new technology patents from Yale University in New Haven, Conn. The technology, dubbed “ring-TIRF microscopy” because it illuminates samples with TIRF as an adjustable ring of light, represents a significant improvement over conventional TIRF.

Ring-TIRF microscopy removes interference fringes and allows fast multiangle illumination to correct for chromatic differences, for 3-D illumination of the cell cortex and for fast photoactivation.

“This is the first major advancement in TIRF microscopy to come about in several years,” said Paul Goodwin, the director of advanced applications at Applied Precision, a GE Healthcare company.

The prototype instrument was developed by Derek Toomre, an associate professor at Yale University School of Medicine, and his colleagues Vladimir Polejaev and Robert Roorda.

“We know the problems and limitation of traditional objective-type TIRF [microscopy], and our ring-TIRF microscopy overcomes them and allows for quantitative and 3-D TIRF imaging,” Toomre said. “We are thrilled that Applied Precision and GE Healthcare are commercializing this technology and will put it in the hands of other scientists to let them better see and manipulate cells.”

“Ring-TIRF is much more user-friendly than conventional TIRF, which will increase the quality of the image and make it much easier for people to use,” Goodwin said.

Applied Precision is integrating ring-TIRF technology into its DeltaVision OMX V4 superresolution microscope systems and expects to launch the product in early 2012.

For more information, visit: www.appliedprecision.com  


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