For fast and efficient automated optical inspection of solar wafers, Baumer Ltd. USA
has introduced its HXC20NIR and HXC40NIR CMOS cameras, which measure electroluminescence and deliver high sensitivity in the near-infrared spectrum. The company says that the cameras are twice as sensitive as monochrome technology at 900 nm, using electroluminescence to effectively detect fractures and failures in the crystal structure of the solar wafer. The images produced yield information on the effectiveness and structural integrity of each wafer prior to the next processing step. The HXC40NIR model offers 2048 x 2048-pixel resolution with a 1:1 aspect ratio. The HXC20NIR produces 2048 x 1018-pixel resolution.
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