Applied Precision Inc.
Applied Precision Inc. of Issaquah, Wash., is set to integrate enhanced total internal reflection fluorescence (TIRF) microscopy into its product line now that is has licensed new technology patents from Yale University in New Haven, Conn. The technology, dubbed “ring-TIRF microscopy” because it illuminates samples with TIRF as an adjustable ring of light, represents a significant improvement over conventional TIRF. Ring-TIRF microscopy removes interference fringes and allows fast multiangle illumination to correct for chromatic differences, for 3-D illumination of the cell cortex and for fast photoactivation. Applied Precision is integrating the new technology into its DeltaVision OMX V4 superresolution microscope systems and expects to launch the product early this year.