Displays’ high-resolution reflective microdisplays are used globally for structured light projection in 3-D optical metrology. The high fill factor (>96%) and linear gray-scale display technology, coupled with the flexibility of the 3DM driver interface, make this the perfect choice for 3-D metrology systems builders. The application-specific driver interface, with its small size, configurable timing, synchronization and I/O ports, has been designed for easy integration into structured light projection systems. So if you want a fast, precise, accurate and cost-effective solution for your AOI, SPI or 3-D inspection system, contact our experts now.
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