SAN DIMAS, Calif., Sept. 3, 2012 — Craic Technologies has announced Spectral Surface Mapping (S2M) capabilities for its Perfect Vision microspectrophotometer line. S2M allows the company’s microspectrometer users to map the spectral variation of surfaces of samples with microscopic spatial resolution.
Surface profiles can be created using UV-VIS-NIR transmission, absorbance, emission, fluorescence and polarization microspectral data. S2M can create maps from Raman microspectral data from the proprietary Apollo Raman microspectrometer.
Users can automatically survey and characterize the entire surface of samples by their spectral characteristics. The device enables them to collect spectral data from thousands of points with a user-defined mapping pattern.
Spectral Surface Mapping includes a software module to be used with the company’s MINERVA microspectrometer control software. When employed with microspectrometers with programmable stages, S2M allows a user to automatically take spectral measurements with user-defined mapping patterns that reach to the limits of the stage itself. With the ability to measure up to a million points, high definition maps of the spectral response of the surface of a sample may be generated.
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