ITT Exelis R&D Director Elected SPIE Fellow
SAN FRANCISCO, Feb. 5, 2013 — Dr. Bob Fiete, director of R&D at ITT Exelis Geospatial Systems, was elected a 2013 SPIE Fellow.
SPIE elects fellows based on significant scientific and technical contributions in optics, photonics and imaging. Fellows are honored for their technical achievements and for their service to SPIE and the general optics community.
Fiete, a pioneer in modeling the imaging chain of digital cameras, created the imaging chain model for Ikonos, the first commercial high-resolution imaging satellite. He also helped the FBI and the US Department of Justice prosecute and convict individuals exploiting children in digital images. He is the author of two books and was the 2000 recipient of the Rudolf Kingslake Medal, awarded in recognition of the most noteworthy paper to appear in SPIE’s Optical Engineering journal.
“Bob’s work has influenced and served many across the fields of justice, defense, intelligence and environmental sensing, making him a tremendous asset not only to our company, but our nation as well,” said Chris Young, president of ITT Exelis of McLean, Va., an aerospace, defense and information solutions company.
For more information, visit: www.exelisinc.com
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