NORTH LOGAN, Utah, Feb. 19, 2013 — Ophir Photonics has announced the NanoScan 2 scanning slit laser beam profiler. NIST-calibrated, it measures continuous-wave and pulsed beams from the UV to the far-infrared.
It features a USB 2.0 interface that provides deep, 12-bit digitization of the signal for enhanced dynamic range up to 35 dB of power. An enhanced digital controller improves the accuracy and stability of measurements. Beam size and beam pointing can be measured with a three-sigma precision of several hundred nanometers. Features include software-controllable scan speed and a “peak connect” algorithm that allows measurement of pulsed and pulse-width-modulated lasers with frequencies of a few kilohertz and higher, with any detector. The ability to alter the drum speed helps increase the dynamic range, allowing a larger operating space for any given scan head.
The system uses moving slits to measure beam sizes from microns to centimeters at beam powers from microwatts to kilowatts, without attenuation. It can simultaneously measure multiple beams and offers an optional power meter for scan heads with silicon and germanium detectors. Detector options include silicon, germanium and pyroelectric.
NanoScan 2 software can measure from one to 16 beams in the NanoScan aperture with submicron precision. A beam can be found in <0.3 s, and real-time updates can be displayed to 20 Hz. The graphical user interface supports the Microsoft Windows ribbon toolbar, and dockable and floatable windows. Support for ActiveX automation lets users integrate NanoScan into OEM systems or write their own user interfaces.
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