AUBURN, Mass., Aug. 9, 2013 — PI (Physik Instrumente) is offering the N-725 optical axis nanopositioning system for high-resolution microscopes. It is compatible with applications such as surface metrology, superresolution and two-photon
microscopy, and other techniques requiring the nanometer- and subnanometer-level resolution and millisecond response provided by piezonanopositioning devices.
The device’s new drive principle is based on coordinated motion of multiple piezo elements, which extend the positioning range to 2 mm while maintaining settling times on the order of 20 ms. The company says that the device offers five times more travel range than comparable devices.
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