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DataRay Inc. - ISO 11146-Compliant Laser Beam Profilers

X-rays Probe Structural Properties of Solids

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BERLIN, Aug. 24, 2013 — A new method uses x-rays to probe the properties of solid materials without destroying them and could mean big things for superconductivity and chemistry studies. X-ray scattering and x-ray emission spectroscopy are powerful techniques — often too powerful, damaging samples or losing measurable signals. But x-ray free-electron lasers combine the optical properties of lasers with the analytic power of x-rays, enabling damage-free probing of solid materials. Inducing stimulated x-ray emission from a solid sample provides a superior probe for low-energy excitation and dispersion in...Read full article

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    Published: August 2013
    Alexander FöhlischBasic ScienceEuropeGermanyHelmholtz Center BerlinImagingLight SourcesMartin BeyeMaterials & ChemicalsphotonsResearch & Technologysolid material probeTest & Measurementx-ray emissionx-ray free-election lasersx-ray scatteringLasersLEDs

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