JENA, Germany, Oct. 7, 2013 — Carl Zeiss Group’s next-generation EVO series scanning electron microscopes (SEMs) deliver work-flow automation, beam-deceleration technology and high-definition imaging for materials and life sciences applications.
Work flow is reduced from more than 400 steps to 15, enabling automated settings such as beam alignment, magnification and focus to provide imaging of areas of interest in the shortest possible time. A new midcolumn click-stop aperture changer offers reproducibility.
The beam deceleration technology and high-definition BSE (backscatter electron) detector provide fine topographical and image detail.
For more information, visit: www.zeiss.de
To contact the manufacturer of this product, click here