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Ametek Acquires Amptek and Luphos

Photonics.com
Aug 2014
BERWYN, Pa., Aug. 6, 2014 — Ametek Inc., a global manufacturer of electronic instruments and electromechanical devices, has acquired Amptek Inc. and Luphos GmbH.

Amptek provides x-ray detectors that utilize x-ray fluorescence for nondestructive materials analysis.

Luphos provides noncontact metrology technology for nanometer level measurements of complex aspherical lenses and optical surfaces using multi-wavelength laser interferometry.

For more information, visit www.ametek.com.


GLOSSARY
interferometry
The study and utilization of interference phenomena, based on the wave properties of light.
metrology
The science of measurement, particularly of lengths and angles.
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