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ASML to Acquire Hermes Microvision for $3.1B

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VELDHOVEN, Netherlands, June 22, 2016 — ASML Holding NV, a provider of lithography systems for the semiconductor industry, will acquire Hermes Microvision Inc. (HMI), a supplier of pattern verification systems for advanced semiconductor devices, to enhance its holistic lithography product portfolio. The deal is valued at about 100 billion TWD (about $3.1 billion). Both companies are developing joint approaches for integrated circuit manufacturers to improve yields in the production of the most advanced microchips. The combination will allow ASML and HMI to further integrate and enhance their product offering at an accelerated...Read full article

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    Published: June 2016
    Glossary
    chip
    1. A localized fracture at the end of a cleaved optical fiber or on a glass surface. 2. An integrated circuit.
    lithography
    Lithography is a key process used in microfabrication and semiconductor manufacturing to create intricate patterns on the surface of substrates, typically silicon wafers. It involves the transfer of a desired pattern onto a photosensitive material called a resist, which is coated onto the substrate. The resist is then selectively exposed to light or other radiation using a mask or reticle that contains the pattern of interest. The lithography process can be broadly categorized into several...
    metrology
    Metrology is the science and practice of measurement. It encompasses the theoretical and practical aspects of measurement, including the development of measurement standards, techniques, and instruments, as well as the application of measurement principles in various fields. The primary objectives of metrology are to ensure accuracy, reliability, and consistency in measurements and to establish traceability to recognized standards. Metrology plays a crucial role in science, industry,...
    BusinessEuropeacquisitionsexpansionASMLhermes microvisionNetherlandshollandchiplithographyindustrialmaterials processingsemiconductorsinspectionTest & MeasurementSoftwaremetrologyEuro News

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