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Integrated Active Thin-Film Cooling Demonstrated

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Temperature variations are the primary cause of wavelength drift in laser sources for optical communications, leading to crosstalk and other sources of error. Thermoelectric coolers are a common solution, but they increase integration costs and can affect the lifetime and reliability of a component. A team from the University of California in Santa Barbara and Santa Cruz has demonstrated that integrated thin-film solid-state coolers are a viable alternative to the thermoelectric cooling of optoelectronic devices. Reporting in the November 2000 issue of Optical Engineering, the...Read full article

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    Published: March 2001
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