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Teradyne Sells Image Sensor Test System in Europe

Photonics.com
Apr 2001
MUNCHEN, Germany, April 10 – Teradyne Inc. said that Silicon Vision AG has purchased an IP750 Image Sensor test system for multisite testing of CCD and CMOS image sensor devices. The IP750, which is based on the INTEGRA J750, has been designed and developed by Teradyne's Japan Division. The IP750 has the 100 MHz digital tester functionalities, and the state-of-art hardware and software architecture that answer the needs for testing CCD/CMOS image sensor devices, which requires complex functional testing.


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