Zurich Instruments AG - Lock-In Amplifiers 4/24 LB

13 products

Photonics Products

Clear All Filters x measurement system x

OL 770 High Speed Test and Measurement System
Optronic Laboratories LLC

Type: Benchtop
Measurement Techniques: Reflectance and Transmission
Spectral Range (nm): 200 - 1100
Width: 18.4cm
Length: 33cm
Height: 33.6cm
Weight (kg): 10.2

SpectrÄ: Spectrally Controlled Interferometry
Apre Instruments

Type: Other

REVEAL Metrology Software
Apre Instruments

Type: Data Acquisition and Analysis

Fluo Sens Fluorescence Sensing Module
Electro Optical Components Inc.

Type: Equipment

Window
DayOptics Inc.

Type: Windows
Diameter / Dimension: 10 - 80mm
Clear Aperture: >85%
Diameter Tolerance: +0.0, -0.2mm
Parallelism: 1′

HI-Q™ Test Measurement Systems - Optical and RF
OEwaves Inc.

Type: Other

F20 Thin-Film Measurement System
Filmetrics, KLA Instruments

Type: Benchtop
Measurement Techniques: Absorption,Reflectance and Transmission,Other
Spectral Range (nm): 190 - 1690
Thickness Accuracy: As little as 1 nm or 0.2%
Thickness Range: 1 nm - 450 um

aRTie Thin-Film Measurement System
Filmetrics, KLA Instruments

Type: Benchtop
Measurement Techniques: Absorption,Reflectance and Transmission,Other
Spectral Range (nm): 380 - 1050
Thickness Accuracy: Greater of 0.2% or 2 nm
Thickness Range: 15nm - 70µm

S neox
Sensofar Metrology

Type: Optical
Spectral Range: VIS

SpecWin Pro
Instrument Systems GmbH

Type: Test and Measurement

Profile360
Starrett-Bytewise Measurement Systems

Type: Camera
Wavelength Range: 635 - 690nm
Interface: GigE
Measurement Field of View: 30 mm up to 600 mm

Crosscheck Laser Line Sensors
Starrett-Bytewise Measurement Systems

Type: Camera
Wavelength Range: 635 - 690nm
Interface: GigE
Measurement Field of View: 30 mm up to 600 mm
Measurement Rate: up to 100 frames/sec

Infrared Optical Windows
Angstrom Precision Optics Inc.

Type: Windows
Diameter / Dimension: 1 - 480mm
Flatness: < 1/30 wave at 632 nm
Parallelism: < 0.5 arcsec
Surface Cosmetics: < 5-2 SD

Photonics Products

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