- Model: X-ray Beam Profiler µBIP
- Company: Star Tech Instruments Inc.
- Type: Camera
- Wavelength Range: 1nm - 400nm
- Max. Beam Diameter: 25mm
- Spot Size: 25µm
- Compatible Sources: CW, Pulsed
- Interface: USB 2.0, USB 3.0
- Wavelength: 1 nm
- High Damage Threshold: 5 W/cm2
- Vacuum: 10-9 torr
High resolution x-ray beam profiler with vacuum flange to 10-9 torr.
PO Box 1822
New Fairfield, CT 06812
United States
Phone: +1 203-312-0767