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Photonics Buyers' Guide
Precision Optics Manufacturing
Precision Thin-Film Coatings
Telecentric Lenses for Machine Vision Technology
LWIR Fixed Focus Objectives
Moxtek Improves UV-Vis-NIR Spectrophotometer Performance
ACM Measuring Simultaneously Pitch, Yaw & Roll Angles
MTF Measurement in UV, VIS, IR
Precision Solutions, Sub. of MBDA (UK) Ltd. - Stevenage, England
The knowledge base and facilities developed by MBDA as part of its systems development programs meet the highest standards, with world class expertise. Recognizing that many of these capabilities could be made more generally available without compromising ongoing and future systems programs, MBDA...
TOPTICA Photonics, Inc. - Victor, NY
TOPTICA is a world leader in diode laser and ultrafast technology for industrial and scientific markets. We offer the widest range of single-mode tunable light in the 190 to 2900 nm and 0.5 to 2.5 THz spectral region with various accessories to measure, characterize, stabilize and analyze light....
Advanced Pellicle Technology - Culver City, CA
Chapman Instruments, Inc. - Rochester, NY
ColdQuanta - Boulder, CO
Corning Tropel Corp., Sub. of Corning Inc. - Fairport, NY
ESDI - Tucson, AZ
Graham Optical Systems - Chatsworth, CA
Inometrix Inc. - Grimsby, Canada
Interferometric Optics - Rochester, NY
LightGage Inc. - Springwater, NY
Metrology Concepts - Rochester, NY
Opt-E - Tucson, AZ
OPTOCRAFT GmbH - Erlangen, Germany
Optodyne, Inc. - Rancho Dominguez, CA
QED Technologies Inc., Sub. of Cabot Microelectronics Corp. - Rochester, NY
RESOLUTION Spectra Systems - Meylan, France
Technix by CBS, Div. of Convenient Business Solutions Inc. - Edmonton, Canada
TRIOPTICS Japan Co., Ltd., Sub. of TRIOPTICS GmbH - Shizuoka, Japan
Verity Instruments, Inc. - Carrollton, TX
An instrument that employs the interference of lightwaves to measure the accuracy of optical surfaces; it can measure a length in terms of the length of a wave of light by using interference phenomena based on the wave characteristics of light....
A representation of the shape of a surface, including any roughness or other irregularities. The profile can be generated by direct measurements, as by a stylus, or by remote measurement, as by an interferometer.
optical surface measurement
interference of light waves
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