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Atomic Force Microscopes

An atomic-force microscope is a type of microscope that produces a quantitative, three-dimensional image of the surface of a sample. The surface is scanned by an extremely sharp tip mounted to a flexible cantilever. The atoms on the tip interact with the atoms on the surface of the sample, causing a deflection of the cantilever; this deflection is monitored and used to generate the image.

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Glossary

atomic force microscope An atomic force microscope (AFM) is a high-resolution imaging and measurement instrument used in nanotechnology, materials science, and biology. It is a type of scanning probe microscope that operates by scanning a sharp tip (usually a few...

Atomic Force Microscopes SuppliersAFMthree-dimensional image3-D image3D imageflexible cantileverdeflectionmicroscopyimagingscientific

Atomic Force Microscopes

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