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Optimax Systems, Inc. - Optical Components & Systems 2024 LB
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Lumencor Inc. - Power of Light 4-24 MR
BAE Systems Sensor Solutions - Fairchild - TWV640 4/24 HP
17 suppliers

Scanning Electron Microscopes (SEM)

A scanning electron microscope is an electron microscope that uses a beam of electrons -- accelerated to high energy and focused on the sample -- to scan the sample surface, ejecting secondary electrons that form the picture of the sample.

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Capovani Brothers Inc. - Scotia, NY
CIQTEK - Hefei, China
Circuit Insights LLC - Pasadena, CA
Delmic BV - Delft, Netherlands
El-Mul Technologies Ltd. - Nes Ziona, Israel
Electron Optics Instruments (EOI) LLC - West Orange, NJ
Hitachi High-Tech America Inc., Life Sciences and Nanotechnology - Dallas, TX
Imina Technologies SA - Cugy, Switzerland
JEOL USA Inc. - Peabody, MA
NanoImages - Lafayette, CA
Norcada Inc. - Edmonton, Canada
Particle Technology Labs (PTL) - Downers Grove, IL
Quartz Imaging Corp. - Vancouver, Canada
Raith America Inc. - Islandia, NY
SEMTech Solutions Inc. - North Billerica, MA
Staib Instruments Inc. - Williamsburg, VA
Carl Zeiss Microscopy GmbH, Microscopy - Jena, Germany
Glossary
  • scanning electron microscope An electron microscope that uses a beam of electrons -- accelerated to high energy and focused on the sample -- to scan the sample surface, ejecting secondary electrons that form the picture of the sample.
Scanning Electron Microscopes (SEM) Supplierselectron microscopebeam electronssecondary electronsSEMinspection microscopeelectron microscopyresearch instrumentsramanmicro scopemicroscopyimagingtest & measurement

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