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Scanning Electron Microscopes (SEM)
Moxtek Improves UV-Vis-NIR Spectrophotometer Performance
ImageMaster Compact MTF Test Station
Ventana Spectrometers
Ultra Compact Fizeau /Twyman Green Interferometers for Optical Testing
IsoPlane – Spectroscopy Without Compromises
OSA150D Fast Optical Spectrum Analyzer
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Bobcat-640 Smallest SWIR GigE Camera
(11 companies)
Scanning Electron Microscopes (SEM)
A scanning electron microscope is an electron microscope that uses a beam of electrons -- accelerated to high energy and focused on the sample -- to scan the sample surface, ejecting secondary electrons that form the picture of the sample.
Agilent Technologies - Chandler, AZ
Capovani Brothers Inc. - Scotia, NY
Cordouan Technologies - Pessac, France
Herzan - Laguna Hills, CA
Hitachi High Technologies America, A Hitachi Co., Electron Microscope Div. - Pleasanton, CA
JEOL USA, Inc., Sub. of JEOL Ltd. - Peabody, MA
Raith USA - Ronkonkoma, NY
SEMTech Solutions Inc. - North Billerica, MA
Staib Instruments, Inc. - Williamsburg, VA
Tescan USA Inc. - Cranberry Township, PA
Carl Zeiss Microscopy, LLC, Member of the Carl Zeiss Group - Thornwood, NY
TERMS
scanning electron microscope (SEM)
An electron microscope that uses a beam of electrons -- accelerated to high energy and focused on the sample -- to scan the sample surface, ejecting secondary electrons that form the picture of the sample.
TAGS
electron microscope
beam electrons
secondary electrons
SEM
inspection microscope
electron microscopy
research instruments
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