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Scanning Probe Microscopes
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Apex 785 Raman Spectrometer
(17 companies)
Scanning Probe Microscopes
Advanced Surface Microscopy, Inc. - Indianapolis, IN
AIST-NT Inc. - Novato, CA
Asylum Research - Santa Barbara, CA
Delta Photonics - Ottawa, Canada
FRT, Fries Research & Technology GmbH - Bergisch Gladbach, Germany
Herzan - Laguna Hills, CA
JEOL USA, Inc., Sub. of JEOL Ltd. - Peabody, MA
JPK Instruments AG - Berlin, Germany
L.O.T.-Oriel Ltd., Sub. of L.O.T.-Oriel Laser Optics Technology GmbH - Leatherhead, England
NanoMagnetics Instruments Ltd. - Oxford, England
Nanonics Imaging Ltd. - Jerusalem, Israel
Nanotec Electronica S.L. - Madrid, Spain
Novascan Technologies, Inc. - Ames, IA
Oxford Instruments, Member of the Oxford Instruments Group plc, Nanoscience - Abingdon, England
SPECS Scientific Instruments, Inc. - Sarasota, FL
Uniscan Instruments Ltd. - Buxton, England
WITec GmbH - Ulm, Germany
TERMS
scanning probe microscope
See atomic force microscope; magnetic force microscope; near-field scanning optical microscope; scanning tunneling microscope.
atomic force microscope (AFM)
A type of microscope that produces a quantitative, three-dimensional image of the surface of a sample. The surface is scanned by an extremely sharp tip mounted to a flexible cantilever. The atoms on the tip interact with the atoms on the surface of...
magnetic force microscope
A variation of the atomic force microscope that operates by scanning a tiny ferromagnetic probe (or a magnetized tip) over a magnetic sample, and detecting the extremely small forces exerted on the probe by the sample's stray magnetic fields. The...
near-field scanning optical microscope (NSOM)
A scanning probe microscope that analyzes the surface of a specimen by recording the intensity of light as it is focused through a pipette and raster scanned across the specimen at a distance less than a wavelength.
TAGS
atomic force microscope
3-D image
3D image
scanning
ferromagnetic probe
magnetic fields
light intensity
specimen surface
research equipment
imaging instrument
fine conductive probe
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