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SCIENTIFIC COMPUTING INTERNATIONAL
6355 Corte Del Abeto, Ste. C105
Carlsbad, CA 92011
United States
Phone: (760) 930-3992
Fax: (760) 930-3994
Provides metrology tools for thin-film characterization, material analysis, spectroscopic ellipsometry and optical thin-film design. Products include a tool that simultaneously and unambiguously measures thickness, index, critical dimensions, surface roughness, composition, crystallinity and optical constants of multilayer structures.
Established: 1993
Employees: 10
Facility area (sq. ft): 8,000
Ownership type: Privately Owned

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