J.A. WOOLLAM CO. INC.
645 M St., Ste. 102
Lincoln, NE 68508-2243
Phone: (402) 477-7501
Fax: (402) 477-8214
Manufactures spectroscopic ellipsometers for thin-film characterization. Measures thickness and refractive index with subnanometer resolution. Characterizes material properties over a wide range from VUV to IR (142 nm to 40 microns). Measurement services available.
Facility area (sq. ft): 15,000
Ownership type: Privately Owned
J.A. WOOLLAM CO. INC. PRODUCT AND SERVICE CATEGORIES
MS=Manufacture Stock | MC=Manufacture Custom | S=Supply/Distribute | D=Design