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Y1000L Laser Diode Test System

Photonics MarketplaceThe Y1000L is a universal tester capable of burn-in aging and life-time testing of multiple photonic devices at the same time. This means any photonic device, any package style and using any test recipe including temperature, current, voltage or optical power, all within the same system.

As the size of photonics devices becomes smaller with increased usage in photonics integrated circuits, the cost of device failure at final functional testing increases dramatically. This increases the need to burn-in and life-test photonics integrated circuits or laser diode devices at an earlier stage during manufacturing.

The Y1000L tests low power lasers up to 1A of current, and is commonly in use by companies within the telecommunications, medical, data communications as well as computer storage industries.

Features:

• Number of drawers per rack: 1 to 4
• Flexible fixtures able to handle most device types
• All power supplies are built-in
• Supports up to 128 temperature zones
• Voltage/Current/Light output spot measurements
• Number of devices under test: up to 2,048 in 1 to 2 racks
• 256 devices per drawer (grouped in modules of 32), each module with fully independent
temperature control on its own hot plate • Chilled air option allows the module to be operated at below ambient
• Flexible, intuitive user interface programmed with LabVIEW™
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