Full company details
BRUKER NANO SURFACES
DIV. OF BRUKER CORP.
3400 E Britannia Dr.
Tucson, AZ 85706
Phone: (520) 741-1044
Fax: (520) 294-1799
IR Nanocharacterization SystemPhotonics Buyers' Guide
SANTA BARBARA, Calif., June 30, 2015 —
Bruker Corp. has introduced an IR nanocharacterization system for use in atomic force microscopy (AFM) applications.
Inspire integrates all required optics, detectors and configurable sources, as well as AFM hardware, into a complete, laser-safe package.
It features 10-nm spatial resolution for scattering scanning near-field optical microscopy (sSNOM), a technique for identifying chemical composition at the nanoscale. The device correlates chemical maps with sample properties, such as modulus, conductivity and workfunction.
Applications include research in graphene, polymers, complex materials and thin films.