Carl Zeiss MicroImaging Inc. has launched the second generation of its Axio Imager microscope system for use in materials microscopy applications. The optical system provides information about the sample in bright- and dark-field, and in confocal and differential interference contrast techniques. The M2m and Z2m models have motorized focus and reflected-light beam paths, and the latter offers automatic component recognition. All models feature the ability to combine reflected and transmitted light, access to the luminous field and aperture diaphragms in the reflected-light beam path, exchangeability of the fine-drive knob and the fine-drive disk, and a redesigned transmitted-light beam path for homogeneous illumination, even at low objective magnifications.

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