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Microscope Systems
Optical
Electron
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Magnification
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Optical
FIR
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Resolution
Electron/Scanning Probe
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pm
nm
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31 products
Microscope Systems
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RF x
Microscopy x
Microscope Systems x
IR VIVO
Photon etc.
Type:
Optical
Spectral Range:
VIS,NIR,SWIR
Emission Spectral Range:
500 - 1620 nm
Field of view:
up to 3 mice
Filter Types:
multi- or hyperspectral
NewView 3D Optical Profiler
Zygo Corporation
Type:
Optical
Spectral Range:
VIS
Compass™ 2
Zygo Corporation
Type:
Optical
Spectral Range:
VIS
ZeGage™ Pro
Zygo Corporation
Type:
Optical
Spectral Range:
VIS
Nexview™ NX2 3D Optical Profiler
Zygo Corporation
Type:
Optical
Spectral Range:
VIS
Contour Elite I
Bruker Nano Surfaces
Type:
Optical
Magnification:
115X
Max Scan:
73 μm / sec
Max Scan Range:
≤10mm
Sample Height:
Up to 100 mm (4 in.)
Modular Infinity Microscope (MIM) System
Applied Scientific Instrumentation Inc.
Type:
Optical
Beamsplitter:
Olympus AX/BX/IX series
Camera Port:
C, T, F and ENG Mounts
Tube Lens:
Nikon, 100, 120, 300 mm
Spero® QCL-IR Microscope
DRS Daylight Solutions Inc.
Type:
Optical
Spectral Range:
MWIR
Image Acquisition Time:
< 40 s for image cube
Imaging Modes:
Transmission and Reflection
Spectral Resolution:
Variable, down to 2 cm-1
MultiMode 8-HR
Bruker Nano Surfaces
Type:
Scanning Probe
Imaging Noise Level:
<30 pm rms
Maximum Sample Size:
15 mm dia × 5 mm thick
Dimension FastScan
Bruker Nano Surfaces
Type:
Scanning Probe
Integral Nonlinearity XYZ:
<0.50%
X-Y Scan Range:
90 μm × 90 μm typical
Z Range:
10 μm typical in imaging
Dimension Edge
Bruker Nano Surfaces
Type:
Scanning Probe
X-Y Scan Range:
85 μm minimum
Z Range:
9.5 μm minimum
NPFLEX
Bruker Nano Surfaces
Type:
Optical
Magnification:
115X
Optical Resolution:
0.33 µm
RMS Reapeatability:
0.004 nm
Vertical Resolution:
<0.1 nm
DektakXT
Bruker Nano Surfaces
Type:
Optical
Data Points Per Scan:
120,000 max.
Stylus Force:
1 to 15 mg with LIS 3 sensor
Vertical Range:
1 mm
Dektak XTL
Bruker Nano Surfaces
Type:
Optical
Stylus Force:
0.03 mg to 15 mg
Vertical Range:
1 mm
Vertical Resolution:
1Å max. (@6.55 µm range)
Contour Elite K
Bruker Nano Surfaces
Type:
Optical
Magnification:
115X
Max Scan:
47 μm/sec
Max Scan Range:
>10 mm
Sample Height:
Up to 100 mm
Dimension Icon
Bruker Nano Surfaces
Type:
Scanning Probe
Integral nonlinearity XYZ:
<0.5% typical
X-Y scan range:
90 μm x 90 μm typical
Z range:
10 μm typical in imaging
JPK NanoWizard AFMs
Bruker Nano Surfaces
Type:
Scanning Probe
Innova
Bruker Nano Surfaces
Type:
Scanning Probe
Closed-Loop, Large-Area Scanner:
XY >90 µm, Z >7.5 µm
Open-Loop, Small-Area Scanner:
XY >5 µm, Z >1.5 µm
Sample Size:
45 mm × 45 mm x 18 mm
Dimension FastScan Bio
Bruker Nano Surfaces
Type:
Scanning Probe
Sample Environment — Flow Cell:
60 μL
X-Y Tip-Velocity Max.:
>2 mm/s
Z Range:
≥3 μm
Ultima Multiphoton
Bruker Nano Surfaces
Type:
Scanning Probe
Scan Size:
64 x 64 to 2048 x 2048
Scanning Method:
Pair of 6mm galvanometers
Tungsten Filament Scanning Electron Microscope SEM3200
CIQTEK
Type:
Electron
Acceleration Voltage:
0.2 kV-30 kV
Extension:
SE\BSE\EDS\EDX\EBSD, etc.
Low Vacuum Mode:
3 nm @ 30 kV (SE)
15000-BD - Versamet 4 Inverted Metallurgical Microscope
UNITRON Ltd.
Type:
Optical
Magnification:
50X
Spectral Range:
VIS
Illumination:
12V 100W halogen w/ECO
Nosepiece:
BF/DF quintuple, DIC slot
Objectives:
BF/DF 5×, 10×, 20×, 50×
14793-TS2 - Inspex 3 on Illuminated Track Stand
UNITRON Ltd.
Type:
Optical
Magnification:
131.6X
Spectral Range:
VIS
Camera Resolution:
1080p, 1980 × 1080, 60fps
Connectivity:
PC
Illumination:
Integrated LED ring light
S wide
Sensofar Metrology
Type:
Optical
Spectral Range:
VIS
Display Resolution:
0.001 µm
Max. Extended Measuring area:
300 × 300 mm
Vertical Measuring Range:
40 mm
S neox Five Axis
Sensofar Metrology
Type:
Optical
Spectral Range:
VIS
S neox
Sensofar Metrology
Type:
Optical
Spectral Range:
VIS
S mart
Sensofar Metrology
Type:
Optical
Spectral Range:
VIS
TM-505B/1005B Series 176-Toolmaker's Microscopes
Mitutoyo America Corp.
Type:
Optical
Magnification:
30X
Spectral Range:
VIS
unity
Aurox Ltd.
Type:
Optical
Size:
482 × 222 × 399 mm
Weight:
20 kg
Active Cantilever Scanning Microscope
Seiwa Optical America Inc.
Type:
Scanning Probe
Cube II Tabletop SEM
NanoImages
Type:
Electron
Resolution:
5nm
Kv:
1-30 kV adjustable
Max. Sample Size:
140 mm horizon 80 mm tall
Pump Down Time:
90 s
Microscope Systems Products
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