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BC43 CF
Andor Technology
Type:
Optical
Core Imaging Modes:
Widefield epifluorescence. Transmitted light - brightfield and differential phase contrast
Imaging Methods:
Single color, multicolor, z-stacking (volume), time-lapse, multi-position, multi-well, montage and 2/3D stitching
Imaging Modes:
3
Spero® QCL-IR Microscope
DRS Daylight Solutions Inc.
Type:
Optical
Spectral Range:
MWIR
Image Acquisition Time:
< 40 s for image cube
Imaging Modes:
Transmission and Reflection
Spectral Resolution:
Variable, down to 2 cm-1
MultiMode 8-HR
Bruker Nano Surfaces
Type:
Scanning Probe
Imaging Noise Level:
<30 pm rms
Maximum Sample Size:
15 mm dia × 5 mm thick
Field Emission Scanning Electron Microscope SEM5000
CIQTEK
Type:
Electron
Acceleration Voltage:
20 V ~ 30 kV
Electron Gun:
High-brightness Schottky
Magnification:
1 ~ 2,500,000 ×
FusionScope Correlative Microscope Platform
Quantum Design Inc.
Type:
Electron
Scan Range XY:
22 × 22 μm
Scan Range Z:
15 μm
S mart
Sensofar Metrology
Type:
Optical
Spectral Range:
VIS
aplanoXX
AdlOptica GmbH
Type:
Optical
Magnification:
20X
Spectral Range:
VIS,NIR
Aberration Correction:
Collar
Clear Aperture:
20 mm
NA:
0.8
Stereo Microscope with Boom Stand
Capovani Brothers Inc.
Type:
Optical
Magnification:
10X
VT-iSIM
VisiTech International Ltd.
Type:
Optical
Spectral Range:
VIS
Axial Resolution:
350 nm
Later Resolution:
125 nm
Pin Hole:
Variable
Model 4200M
Hinalea Imaging
Type:
Optical
Spectral Range:
VIS,NIR
Number of Spectral Bands:
300 nominal, 600 maximum
Sensor Spatial Resolution:
2.3
Spectral Range:
4-0 - 1,000 nm
Microscope Systems Products
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