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OSI Optoelectronics - Design & Manufacturing Standard Oct 22 MR
Zurich Instruments AG - Explore Nanoscale 6/24 HP
17 products

Microscope Systems

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BC43 CF
BC43 CF
Andor Technology
  • Type: Optical
  • Core Imaging Modes: Widefield epifluorescence. Transmitted light - brightfield and differential phase contrast
  • Imaging Methods: Single color, multicolor, z-stacking (volume), time-lapse, multi-position, multi-well, montage and 2/3D stitching
  • Imaging Modes: 3
IMA™ - Hyperspectral Microscope
IMA™ - Hyperspectral Microscope
Photon etc.
  • Type: Optical
  • Spectral Range: VIS,NIR,SWIR
  • Camera: CCD, EMCCD, InGaAs
  • Darkfield Module: Oil, Dry
  • Excitation Wavelengths: 405, 532, 730, 785, 808
IR VIVO
IR VIVO
Photon etc.
  • Type: Optical
  • Spectral Range: VIS,NIR,SWIR
  • Emission Spectral Range: 500 - 1620 nm
  • Field of view: up to 3 mice
  • Filter Types: multi- or hyperspectral
Contour Elite I
Contour Elite I
Bruker Nano Surfaces
  • Type: Optical
  • Magnification: 115X
  • Max Scan: 73 μm / sec
  • Max Scan Range: ≤10mm
  • Sample Height: Up to 100 mm (4 in.)
Spero® QCL-IR Microscope
Spero® QCL-IR Microscope
DRS Daylight Solutions Inc.
  • Type: Optical
  • Spectral Range: MWIR
  • Image Acquisition Time: < 40 s for image cube
  • Imaging Modes: Transmission and Reflection
  • Spectral Resolution: Variable, down to 2 cm-1
MultiMode 8-HR
MultiMode 8-HR
Bruker Nano Surfaces
  • Type: Scanning Probe
  • Imaging Noise Level: <30 pm rms
  • Maximum Sample Size: 15 mm dia × 5 mm thick
Innova
Innova
Bruker Nano Surfaces
  • Type: Scanning Probe
  • Closed-Loop, Large-Area Scanner: XY >90 µm, Z >7.5 µm
  • Open-Loop, Small-Area Scanner: XY >5 µm, Z >1.5 µm
  • Sample Size: 45 mm × 45 mm x 18 mm
Dimension FastScan
Dimension FastScan
Bruker Nano Surfaces
  • Type: Scanning Probe
  • Integral Nonlinearity XYZ: <0.50%
  • X-Y Scan Range: 90 μm × 90 μm typical
  • Z Range: 10 μm typical in imaging
Contour Elite K
Contour Elite K
Bruker Nano Surfaces
  • Type: Optical
  • Magnification: 115X
  • Max Scan: 47 μm/sec
  • Max Scan Range: >10 mm
  • Sample Height: Up to 100 mm
Ultima Multiphoton
Ultima Multiphoton
Bruker Nano Surfaces
  • Type: Scanning Probe
  • Scan Size: 64 x 64 to 2048 x 2048
  • Scanning Method: Pair of 6mm galvanometers
Dimension Icon
Dimension Icon
Bruker Nano Surfaces
  • Type: Scanning Probe
  • Integral nonlinearity XYZ: <0.5% typical
  • X-Y scan range: 90 μm x 90 μm typical
  • Z range: 10 μm typical in imaging
Field Emission Scanning Electron Microscope SEM5000
Field Emission Scanning Electron Microscope SEM5000
CIQTEK
  • Type: Electron
  • Acceleration Voltage: 20 V ~ 30 kV
  • Electron Gun: High-brightness Schottky
  • Magnification: 1 ~ 2,500,000 ×
EXI-600M
EXI-600M
ACCU-SCOPE Inc.
  • Type: Optical
  • Magnification: 100X
  • Camera Ports: 3 ports: left, right, top
  • Condenser: 6-position turret
  • Display: LCD screen display
UVBG Longpass Fluorescence Filter set LP-FITC
UVBG Longpass Fluorescence Filter set LP-FITC
Optolong Optics Co. Ltd
  • Type: Optical
  • Spectral Range: UV,VIS
  • DM: 500
  • Emission Filter: LP510
  • Excitation Filter: 475/40
SYIONS
SYIONS
JENOPTIK Optical Systems LLC, Advanced Photonic Solutions
  • Type: Optical
  • Spectral Range: UV,VIS,NIR
  • Fully customizable:
Active Cantilever Scanning Microscope
Active Cantilever Scanning Microscope
Seiwa Optical America Inc.
  • Type: Scanning Probe
Model 4200M
Model 4200M
Hinalea Imaging
  • Type: Optical
  • Spectral Range: VIS,NIR
  • Number of Spectral Bands: 300 nominal, 600 maximum
  • Sensor Spatial Resolution: 2.3
  • Spectral Range: 4-0 - 1,000 nm
Microscope Systems Products


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