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SCANLAB GmbH - Laser Beam Deflection 2024 LB
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PI Physik Instrumente - 50 ways hexapod MR 5/24
OSI Optoelectronics - HIGH Performance HP 6/24
11 products

Microscope Systems

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MultiMode 8-HR
MultiMode 8-HR
Bruker Nano Surfaces
  • Type: Scanning Probe
  • Imaging Noise Level: <30 pm rms
  • Maximum Sample Size: 15 mm dia × 5 mm thick
JPK NanoWizard AFMs
JPK NanoWizard AFMs
Bruker Nano Surfaces
  • Type: Scanning Probe
Innova
Innova
Bruker Nano Surfaces
  • Type: Scanning Probe
  • Closed-Loop, Large-Area Scanner: XY >90 µm, Z >7.5 µm
  • Open-Loop, Small-Area Scanner: XY >5 µm, Z >1.5 µm
  • Sample Size: 45 mm × 45 mm x 18 mm
Dimension FastScan Bio
Dimension FastScan Bio
Bruker Nano Surfaces
  • Type: Scanning Probe
  • Sample Environment — Flow Cell: 60 μL
  • X-Y Tip-Velocity Max.: >2 mm/s
  • Z Range: ≥3 μm
Dimension FastScan
Dimension FastScan
Bruker Nano Surfaces
  • Type: Scanning Probe
  • Integral Nonlinearity XYZ: <0.50%
  • X-Y Scan Range: 90 μm × 90 μm typical
  • Z Range: 10 μm typical in imaging
Dimension Edge
Dimension Edge
Bruker Nano Surfaces
  • Type: Scanning Probe
  • X-Y Scan Range: 85 μm minimum
  • Z Range: 9.5 μm minimum
Ultima Multiphoton
Ultima Multiphoton
Bruker Nano Surfaces
  • Type: Scanning Probe
  • Scan Size: 64 x 64 to 2048 x 2048
  • Scanning Method: Pair of 6mm galvanometers
Dimension Icon
Dimension Icon
Bruker Nano Surfaces
  • Type: Scanning Probe
  • Integral nonlinearity XYZ: <0.5% typical
  • X-Y scan range: 90 μm x 90 μm typical
  • Z range: 10 μm typical in imaging
FS-70 Series 378-Microscope Unit
FS-70 Series 378-Microscope Unit
Mitutoyo America Corp.
  • Type: Optical
  • Magnification: 20X
  • Spectral Range: VIS
Vividia ME-610 Industrial Automotive Videoscope Borescope
Vividia ME-610 Industrial Automotive Videoscope Borescope
Oasis Scientific Inc.
  • Type: Optical
  • Magnification: 4X
  • Angle of Field: 100 degree
  • LED Lights: 6 pcs
  • Monitor Size: 3.5 inch
Active Cantilever Scanning Microscope
Active Cantilever Scanning Microscope
Seiwa Optical America Inc.
  • Type: Scanning Probe
Microscope Systems Products

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