Microscope Systems

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BC43 CF
Andor Technology

Type: Optical
Core Imaging Modes: Widefield epifluorescence. Transmitted light - brightfield and differential phase contrast
Imaging Methods: Single color, multicolor, z-stacking (volume), time-lapse, multi-position, multi-well, montage and 2/3D stitching
Imaging Modes: 3

Contour Elite I
Bruker Nano Surfaces

Type: Optical
Magnification: 115X
Max Scan: 73 μm / sec
Max Scan Range: ≤10mm
Sample Height: Up to 100 mm (4 in.)

Innova
Bruker Nano Surfaces

Type: Scanning Probe
Closed-Loop, Large-Area Scanner: XY >90 µm, Z >7.5 µm
Open-Loop, Small-Area Scanner: XY >5 µm, Z >1.5 µm
Sample Size: 45 mm × 45 mm x 18 mm

Dektak XTL
Bruker Nano Surfaces

Type: Optical
Stylus Force: 0.03 mg to 15 mg
Vertical Range: 1 mm
Vertical Resolution: 1Å max. (@6.55 µm range)

Field Emission Scanning Electron Microscope SEM5000
CIQTEK

Type: Electron
Acceleration Voltage: 20 V ~ 30 kV
Electron Gun: High-brightness Schottky
Magnification: 1 ~ 2,500,000 ×

15000-BD - Versamet 4 Inverted Metallurgical Microscope
UNITRON Ltd.

Type: Optical
Magnification: 50X
Spectral Range: VIS
Illumination: 12V 100W halogen w/ECO
Nosepiece: BF/DF quintuple, DIC slot
Objectives: BF/DF 5×, 10×, 20×, 50×

S mart
Sensofar Metrology

Type: Optical
Spectral Range: VIS

ViTiny Digital Microscope
Oasis Scientific Inc.

Type: Optical
Magnification: 120X
Build-in LED Lights: 32
Max Magnification on 27" LCD: 166
Objective Lens: 4× or 10× (optional)

Microscope Systems Products

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